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 PLASTIC INFRARED LIGHT EMITTING DIODE QEC112
PACKAGE DIMENSIONS
0.116 (2.95) REFERENCE SURFACE 0.052 (1.32) 0.032 (0.082) 0.193 (4.90)
QEC113
0.030 (0.76) NOM 0.800 (20.3) MIN
0.050 (1.27)
CATHODE 0.100 (2.54) NOM
0.155 (3.94) 0.018 (0.46) SQ. (2X)
SCHEMATIC
NOTES:
ANODE
1. Dimensions for all drawings are in inches (mm). 2. Tolerance of .010 (.25) on all non-nominal dimensions unless otherwise specified.
CATHODE
DESCRIPTION
The QEC11X is an 940 nm GaAs LED encapsulated in a clear peach tinted, plastic T-1 package.
FEATURES
* = 940 nm * Chip material = GaAs * Package type: T-1 (3mm) * Matched Photosensor: QSC112 * Narrow Emission Angle, 24 * High Output Power * Package material and color: Clear, peach tinted plastic
2001 Fairchild Semiconductor Corporation DS300334 5/21/01
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www.fairchildsemi.com
PLASTIC INFRARED LIGHT EMITTING DIODE QEC112
ABSOLUTE MAXIMUM RATINGS
Parameter Operating Temperature Storage Temperature Soldering Temperature (Iron)(2,3,4) Soldering Temperature (Flow)(2,3) Continuous Forward Current Reverse Voltage Power Dissipation(1) (TA = 25C unless otherwise specified) Symbol TOPR TSTG TSOL-I TSOL-F IF VR PD Rating -40 to +100 -40 to +100 240 for 5 sec 260 for 10 sec 50 5 100 Unit C C C C mA V mW
QEC113
1. Derate power dissipation linearly 1.33 mW/C above 25C. 2. RMA flux is recommended. 3. Methanol or isopropyl alcohols are recommended as cleaning agents. 4. Soldering iron 1/16" (1.6mm) minimum from housing.
ELECTRICAL / OPTICAL CHARACTERISTICS
PARAMETER TEST CONDITIONS
(TA =25C)
SYMBOL
PE
MIN
TYP
MAX
UNITS
Peak Emission Wavelength Emission Angle Forward Voltage Reverse Current Radiant Intensity QEC112 Radiant Intensity QEC113 Rise Time Fall Time
IF = 100 mA IF = 100 mA IF = 100 mA, tp = 20 ms VR = 5 V IF = 100 mA, tp = 20 ms IF = 100 mA, tp = 20 ms IF = 100 mA 2
-- -- -- 6 14 -- --
940 24 -- -- -- -- 1000 1000
-- 1.5 10 30 -- -- --
nm Deg. V A mW/sr mW/sr ns ns
1/2
VF IR IE IE tr tf
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DS300334
PLASTIC INFRARED LIGHT EMITTING DIODE QEC112
TYPICAL PERFORMANCE CURVES
QEC113
Fig.1 Normalized Radiant Intensity vs. Forward Current
Ie - NORMALIZED RADIANT INTENSITY
10 Normalized to: IF = 100 mA Pulsed tpw = 100 s Duty Cycle = 0.1 % TA = 25C
Fig.2 Coupling Characteristics of QEC11X And QSC11X
IC (ON) - NORMALIZED COLLECTOR CURRENT (mA)
1.0 Normalized to: d=0 IF Pulsed tpw = 100 s Duty Cycle = 0.1 % VCC = 5 V RL = 100 TA = 25C
0.8
1
0.6
0.1
0.4
0.01
0.2 IF = 20 mA 0.0 0 1
IF = 100 mA
0.001 1 10 100 1000
2
3
4
5
6
7
8
IF - FORWARD CURRENT (mA)
LENS TIP SEPARATION (INCHES)
Fig.3 Forward Voltage vs. Ambient Temperature
2.0 IF = 50 mA
0.8 1.0 0.9
Fig. 4 Normalized Intensity vs. Wavelength
VF - FORWARD VOLTAGE (V)
1.5 IF = 100 mA
NORMALIZED INTENSITY
0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0 875
1.0 IF = 20 mA
IF = 10 mA
0.5
Normalized to: IF Pulsed tpw = 100 s Duty Cycle = 0.1 % -20 0 20 40 60 80 100
0.0 -40
900
925
950
975
1000
1025
TA - AMBIENT TEMPERATURE (C)
(nm)
Fig. 5 Radiation Diagram
110 120 130 140 150 160 170 180 1.0 0.8 0.6 0.4 0.2 0.0 0.2 0.4 0.6 0.8 1.0 100 90 80 70 60 50 40 30 20 10 0
DS300334
5/21/01
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PLASTIC INFRARED LIGHT EMITTING DIODE QEC112 QEC113
DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body,or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in labeling, can be reasonably expected to result in a significant injury of the user. 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
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